这硬盘是要坏了吗,谁会看这参数,才新买十多天 - V2EX
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这硬盘是要坏了吗,谁会看这参数,才新买十多天

  •  
  •   Alucns 2016-05-03 20:31:32 +08:00 via iPhone 3258 次点击
    这是一个创建于 3526 天前的主题,其中的信息可能已经有所发展或是发生改变。
    [root@localhost ~]# martctl --all /dev/sdb
    smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.0-327.13.1.el7.x86_64] (local build)
    Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

    === START OF INFORMATION SECTION ===
    Device Model: WDC WD5003ABYZ-011FA0
    Serial Number: WMAYP6462459
    LU WWN Device Id: 0 000000 000000000
    Firmware Version: 90.04R.9
    User Capacity: 500,107,862,016 bytes [500 GB]
    Sector Size: 512 bytes logical/physical
    Device is: Not in smartctl database [for details use: -P showall]
    ATA Version is: ATA8-ACS (minor revision not indicated)
    SATA Version is: SATA 2.6, 3.0 Gb/s
    Local Time is: Tue May 3 20:12:18 2016 CST
    SMART support is: Available - device has SMART capability.
    SMART support is: Enabled

    === START OF READ SMART DATA SECTION ===
    SMART overall-health self-assessment test result: PASSED

    General SMART Values:
    Offline data collection status: (0x84) Offline data collection activity
    was suspended by an interrupting command from host.
    Auto Offline Data Collection: Enabled.
    Self-test execution status: ( 0) The previous self-test routine completed
    without error or no self-test has ever
    been run.
    Total time to complete Offline
    data collection: (12000) seconds.
    Offline data collection
    capabilities: (0x7b) SMART execute Offline immediate.
    Auto Offline data collection on/off support.
    Suspend Offline collection upon new
    command.
    Offline surface scan supported.
    Self-test supported.
    Conveyance Self-test supported.
    Selective Self-test supported.
    SMART capabilities: (0x0003) Saves SMART data before entering
    power-saving mode.
    Supports SMART auto save timer.
    Error logging capability: (0x01) Error logging supported.
    General Purpose Logging supported.
    Short self-test routine
    recommended polling time: ( 2) minutes.
    Extended self-test routine
    recommended polling time: ( 140) minutes.
    Conveyance self-test routine
    recommended polling time: ( 5) minutes.
    SCT capabilities: (0x303f) SCT Status supported.
    SCT Error Recovery Control supported.
    SCT Feature Control supported.
    SCT Data Table supported.

    SMART Attributes Data Structure revision number: 16
    Vendor Specific SMART Attributes with Thresholds:
    ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
    1 Raw_Read_Error_Rate 0x002f 175 166 051 Pre-fail Always - 7841
    3 Spin_Up_Time 0x0027 148 148 021 Pre-fail Always - 3575
    4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 7
    5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 5
    7 Seek_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
    9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 469
    10 Spin_Retry_Count 0x0033 100 253 051 Pre-fail Always - 0
    11 Calibration_Retry_Count 0x0032 100 253 051 Old_age Always - 0
    12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7
    184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
    187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 7810
    188 Command_Timeout 0x0032 100 099 000 Old_age Always - 1
    190 Airflow_Temperature_Cel 0x0022 075 067 000 Old_age Always - 25
    192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 4
    193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 2
    194 Temperature_Celsius 0x0022 118 110 000 Old_age Always - 25
    195 Hardware_ECC_Recovered 0x0036 200 200 000 Old_age Always - 0
    196 Reallocated_Event_Count 0x0032 198 198 000 Old_age Always - 2
    197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 29
    198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
    199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
    200 Multi_Zone_Error_Rate 0x0009 100 253 051 Pre-fail Offline - 0

    SMART Error Log Version: 1
    Warning: ATA error count 7810 inconsistent with error log pointer 1

    ATA Error Count: 7810 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
    Powered_Up_Time is measured from power on, and printed as
    DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
    SS=sec, and sss=millisec. It "wraps" after 49.710 days.

    Error 7810 occurred at disk power-on lifetime: 469 hours (19 days + 13 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 20 51 c9 a9 e0 Error: UNC 32 sectors at LBA = 0x00a9c951 = 11127121

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 20 b8 c9 a9 e0 08 19d+11:06:57.106 READ DMA
    c8 00 08 28 ba a9 e0 08 19d+11:06:57.095 READ DMA

    SMART Self-test log structure revision number 1
    No self-tests have been logged. [To run self-tests, use: smartctl -t]


    SMART Selective self-test log data structure revision number 1
    SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
    1 0 0 Not_testing
    2 0 0 Not_testing
    3 0 0 Not_testing
    4 0 0 Not_testing
    5 0 0 Not_testing
    Selective self-test flags (0x0):
    After scanning selected spans, do NOT read-scan remainder of disk.
    If Selective self-test is pending on power-up, resume after 0 minute delay.
    4 条回复    2016-05-03 23:04:28 +08:00
    mN71eOOprFyMsnPx
        1
    mN71eOOprFyMsnPx  
       2016-05-03 21:16:30 +08:00
    === START OF READ SMART DATA SECTION ===
    SMART overall-health self-assessment test result: PASSED

    不是已经自检通过了吗?
    fcicq
        2
    fcicq  
       2016-05-03 22:19:16 +08:00   1
    应该是新盘但是有坏道啊, 做个长 SMART 检测或者扫一下坏道看看情况, 做坏道隔离. 总之重要用途应该是不行了.
    powergx
        3
    powergx  
       2016-05-03 22:20:20 +08:00 via iPhone
    长测会自动重映射
    Alucns
        4
    Alucns  
    OP
       2016-05-03 23:04:28 +08:00 via iPhone
    @fcicq 谢谢,看来真不行了
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